Reliability Evaluation of Thick Film Resistors Through Measurement of Third Harmonic Index
نویسندگان
چکیده
منابع مشابه
Noise properties of thick-film resistors in extended temperature range
Results of thorough experimental studies on electrical properties of thick-film resistors (TFRs) have been overviewed and summarized. Experiments covered resistance and noise measurements in wide temperature range. Low-frequency noise spectroscopy has been used for the investigations of fluctuating phenomena. Sample resistors were prepared of various combinations of commercial and laboratory-ma...
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Thermal noise and 1/f noise are known to exist in carbon composition (CC) and thick film (TF) resistors. A circuit involving a differential instrumentation op-amp was used to measure the noise of a resistor under test. The noise spectra of these resistors were measured using a dynamic signal analyzer that performs an auto-correlation Fourier transform from the time domain to the frequency domai...
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Low-frequency noise spectroscopy is used to examine the interactions between resistive and conductive films that take place during thick-film resistor (TFR) fabrication. Two noise parameters are introduced to quantitatively describe the strength of these interactions. They refer to intensity and repeatability of the noise generated in the resistor interfaces. Extensive experimental studies perf...
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ژورنال
عنوان ژورنال: ElectroComponent Science and Technology
سال: 1981
ISSN: 0305-3091
DOI: 10.1155/apec.8.167